Ferroelectric/Antiferroelectric Pb(Zr0.8Ti0.2)O3/PbZrO3 Epitaxial Multilayers: Growth and Thickness-Dependent Properties
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Epitaxial strain stabilization of a ferroelectric phase in PbZrO3 thin films
PbZrO3/SrRuO3/SrTiO3 (100) epitaxial heterostructures with different thickness of the PbZrO3 (PZO) layer (dPZO ∼ 5–160 nm) were fabricated by pulsed laser deposition. The ultrathin PZO films (dPZO 10 nm) were found to possess a rhombohedral structure. On increasing the PZO film thickness, a bulk like orthorhombic phase started forming in the film with dPZO ∼ 22 nm and became abundant in the thi...
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